New scanning electron microscopy service

Do you want to visualize your nanomaterials? Whether you are a private company or a public organization, our new scanning electron microscopy service is available for you. A new device, a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) CROSSBEAM 540, has been added to our list in order to offer you a service adapted to your needs. Here are some characteristics of our SEM:

– Sub-nanometric resolution
– High precision elemental analysis (EDS)
–   Sample preparation service available
– Support during the development of your protocol
– And many others

To see the detailed brochure (FR)